Name: Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

ホーム > 製品 > Spring Test Probes >

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

起源の場所:

中国

ブランド名:

WINNER

証明:

ISO9100

送信

引用を要求しなさい

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

製品詳細

製品名:

スプリングテストプローブ

バレル:

PB、金メッキ

ボトムプランジャー:

BeCu/SK4、金メッキ

トッププランジャー:

Pd合金/メッキなし

春:

SWPB(SUS)/金メッキ

可用性:

利用可能なカスタムサイズ

コーティング:

金メッキ

電流定格:

接触抵抗:

最大100ミリオーム

帯域幅:

-0.17dB @ 19.6GHz

インダクタンス:

1.25nH

キャプタンス:

1.61pF

フルストローク:

1.00mm

定数ストローク:

0.65mm

スプリングフォース:

30グラム@o.65mm

機械的寿命の超過:

200k

ハイライト:

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

支払及び船積みの言葉

最小注文数量

3000pcs

価格

999

パッケージの詳細

ニュートリアルパッキングまたはOEMロゴ付き

受渡し時間

5～8営業日

支払条件

L/C、ウェスタンユニオン、T/T

供給の能力

1 か月あたりの 100000 ロール

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

お問い合わせ

China Supplier ICT test probe P048

お問い合わせ

CHINA Supply YF-100 Brass Material Spring Contact Probe Pin

お問い合わせ

工場直販価格スプリングテストピンプローブ

お問い合わせ

送信

今接触

製品の説明

High Efficiency BGA Testing Probes

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications.

Key Product Features

Ultra-Fine Precision: 0.11 mm plunger and 0.15 mm barrel for micro-pitch PCB pads, IC leads, flex circuits, and semiconductor testing
High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Production Specifications

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

札：

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Spring Test Probe

Ultra-Fine Precision BGA Testing Probe

Customizable Tip Styles Semiconductor Test Pin

Gold Plated Ultra-Fine Precision Spring Test Probe with Customizable Tip Styles for BGA Testing and Semiconductor Applications

China Supplier ICT test probe P048

CHINA Supply YF-100 Brass Material Spring Contact Probe Pin

工場直販価格スプリングテストピンプローブ

黄金で覆われたウルガム線電子機器

0.01mm tungsten wire R&D

gold plated molybdenum wire electronics